Spectral signature of leaf spot (Mycosphaerella fragariae) in strawberry plants (Fragaria x ananassa Duch) related to NDVI and NDRE index
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Abstract
Introduction: The strawberry crop is seriously affected by different diseases that result in a decrease in production and fruit quality. Among the most important diseases that attack the strawberry crop is Mycosphaerella fragariae, the causal agent of leaf spot, which in advanced stages can lead to the total loss of the crop. Monitoring of this disease is a fundamental tool for its prevention and control. The tools of precision agriculture and agriculture 4.0, such as images obtained by drones, facilitate decision making by producers and optimize crop work such as monitoring.
Objetive: This study identified the relationship between the percentage of area affected by leaf spot (Mycosphaerella fragaraiae) and the NDVI and NDRE indices.
Metodology: The study was developed in the province of Pamplona in Norte de Santander with high inoculum pressure of Mycosphaerella fragariae. Leaflets were collected from strawberry plants with different degrees of affectation caused by Mycosphaerella fragariae, this plant material was transported guaranteeing its conservation until the laboratory, where measurements were made with the Stellar Net brand EPP2000 portable spectroradiometer, from which the values of the red band, infrared and the red border of each one was taken to perform the calculation of several indices including NDVI and NDRE, these values were averaged for each degree of affectation. The exact affected area was calculated for each leaf using the Compu eye leaf and symptom area software and the correlation coefficients were calculated looking for a mutual linear relationship from simple linear regressions.
Results: The NDRE index correlates 82% with the area affected by Mycosphaerella fragariae by up to 70%.
Conclusión: The percentage of area affected by leaf freckle (Mycosphaerella fragariae) is directly related to the spectral response in terms of NDVI and NDRE indices.
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